silicon-intensifier-target

monochromator


Monte


Carlo


multislice


multi-stage


nano-beam


NBD


Neel


noise


nonisochromaticity


nonlinear


occupied


19975


ctopol


off-axial


curvature


diffusion


rotary


omega


on-site


optical-axis


alignment


ordered


disordered


oscillator


outgas


overfocus


paraelectric


paramagnetic


paraxial


PCTF


peak-to-background


PEELS


Peltier


cooling


Penning


phase-contrast


phonon


photodiode


photomultiplier


Pirani


cleaning


plasmon


PMT


pneumatic


damper


Poendel


Loesung


Poisson


polycrystal


post-column


post-magnetic


precipitate


pre-evacuation


pre-magnetic


probe-current


projector


rojectio


pulse-height


quadrupole


quantitative


compositional


quasicrystal


radial


damage


Radon


reciprocal


relativistic


relaxation


replica


rocking


Ronchigram


rotationally


symmetric


rotation-free


rotation-inversion


rough


Rowland


Rutherford


SAD


microscope


TE


Scherzer


Schottky


Schottky-type


scintillator


luorescent


substanc


screw


scroll


SDD


　


secondary-electron


segregation


Seidel’s


five


aberrations


selected-area


ntermediate-lens


apertur


SEM


semiconductor


olid-state


detecto


side-entry


silicon


silicon-intensifier-target

Moire

step


focused


ion-beam


milling


focusing


forbidden


synthesis


Fourier-log


Fraunhofer


Fresnel


Friedel’s


width


FWHM


F効果


Gatan


Gaussian


gentle


glide


HAADF-STEM


hairpin


filament


hexapole


extupol


high-angle


scanning


high-contrast


high-definition


higher-order


Laue


accelerated


high-pass


photography


high-tension


oltag


wobbler


hollow-cone


beam


illumination


Hough


Howie-Whelan


equation


HREM


hydrocarbon


hysteresis


illumination-lens


rotation


immersion


imperfect


impurity


incidence


inclusion


incolumn


incommensurate


inelastically


inner-shell


or


interband


electrons


intermediate


intermetallic


intraband


inverse


inversion


inverted


cleaner


sputtering


ionization


isochromaticity


valve


isotropy


LACBED


lanthanum


hexaboride


large-angle


19930


vibration


least-squares


19933


liner


liquid-metal


liquid-nitrogen


trap


Lorentz


Lorentzian


low-angle


low-pass


luminous


olenoi


many-beam


marker


entropy


MBE


MCP


MDS


path


mechanical


MEM


micro-channel


microgrid


microtomy


Miller


mirror


cone


Gaussian/Lorentzian


modulated


Moellenstedt


Moire

focu

fitting


CWC


damping


Debye-Scherrer


ring


Debye-Waller


deconvolution


deflection


coil


defocus


deformation


degas


deposition


depth


limit


detective


diamagnetic


diamond


knife


dielectric


constant


differential


interference


pumping


diffracted


diffractogram


tableau


diffuse


streak


dimple


grinder


least


dislocation


loop


displacement


distortion


divergence


dose


19787


DQE


ancellatio


Drude


dry-pumping


dynamical


EBSD


EELS


eikonal


einzel


elastically


scattered


electrolytic


plating


backscatter


channeling


energy-loss


spectroscopy


hologram


holography


optics


prism


electron-probe


microanalyzer


electrostatic


lementa


mapping


ELNES


analyzer


energy-dispersive


near-edge


energy-selection


slit


envelope


EOS


epitaxy


EPMA


qua


thickness


peak


etching


eucentric


goniometer


Ewald


sphere


excitation


EXELFS


fine


disturbance


nterferenc


distance


extractor


electrode


Faraday


Fourier


FEG


Fermi


ferromagnetic


19845


fiber


fiberoptic


19848


filler


finger


19851


fluorescent


yield


epth


focu

CTF

Auger


axial


aberration


azimuth


zimuthal


angl


A効果


B-A


acuu


gauge


focal


backing


backscattered


backscattered-electron


back-stream


bakeout


baking


band


beam-rocking


bend


contour


qual


inclination


fring


beryllium


specimen


tilting


EDS


Bethe’s


biprism


Bloch


Boersch


Born


approximation


Bragg


bremsstrahlung


bright-field


brightness


Brillouin


Burgers


vector


calibration


calorimeter


camera


length


Castaing-Henry


CAomposition


thickness-fringethod


cathode


cathode-ray


cathodoluminescence


caustic


CBED


CCD


centro-symmetry


Cerium


bismuth


single-crystal


tip


characteristic


ordering


charge-coupled


order/disorder


polishing


chemical-bonding


chirality


chromatic


cleaving


Cliff-Lorimer


coating


Cockcroft-Walton’s


high-voltage


coherence


cold


athod


field-emission


column


19719


composite


compound


concave


grating


condenser


condenser-objective


-O


len


conductive


continuous


contrast


convergence


convergent-beam


diffraction


coolant


efrigeran


core-hole


interaction


core-loss


Cornu


correlation


critical-voltage


crossover


CRT


crushing


cryo


splitting


orientation


CTF

microanalysis

マクネマー検定


マクニマー検定


マンテル・エクステンシ%


マンテルヘンツェル検定


マンホイットニーのU検定


無限母集団


無作為化


無相関


名義尺度


目的変数


有意水準


有限母集団


尤度


尤度関数


ヨンキー検定


ヨンクヒール検定


ヨンクヒール・タプスト%


リスク比


量的データ


リリフォース検定


ルビーン検定


連関


連関係数


連関表


レンジ


ロジスティック回帰分析


ロジット


ロバストネス


歪度


AIC


C管理図


Cox回帰


Cox比例ハザードモデル


F検定


F分布


GLM


L4直交表


L8直交表


L9直交表


P管理図


P値


ROC曲線


t検定


T得点


t分布


VIF


Xbar-R管理図


z得点


理論


照射系


レンズ系


試料室


検出系


真空系


分光分析


結晶等


隧ｦ譁咏ｭ黄ｦ譁吶♀繧%


画像処理


absorption


potential


absorption-edge


accelerating


cceleratio


voltage


angle


accidental


reflection


achromatic


magnetic-field


canceller


AEM


airy


ALCHEMI


alfa


filter


alloy


amorphous


amplitude-phase


diagram


region


analytical


microscopy


polepiece


analyzing


anaplat


anastigmat


anisotropy


annealing


dark-field


detector


anode


anomalous


anti-contamination


antiferroelectric


antiferromagnetic


anti-phase


domain


diameter


astigmatic


difference


form


scattering


atomic-number


atom-location


by


channeling-enhanced


microanalysis